SAMSEM — A Generic and Scalable Approach for IC Metal Line Segmentation Authors: Christian Gehrmann, Jonas Ricker, Simon Damm, Deruo Cheng, Julian Speith, Yiqiong Shi, Asja Fischer, Christof Paar | Published: 2026-03-17 セグメンテーション手法Loss FunctionDesign Verification 2026.03.17 2026.03.19 Literature Database